叶腊石微结构及其晶体结构缺陷的高分辨透射电镜分析Determination of Microstructure and Defect Structure in Pyrophyllite by High-Resolution Transmission Electron Microscopy
严俊;张俭;胡仙超;姚程;方伟;盛嘉伟;
摘要(Abstract):
采用场发射扫描电镜(FE-SEM)、高分辨透射电镜(HRTEM)结合选区电子衍射(SAED)、X射线粉晶衍射(XRD)及X射线荧光光谱(XRF)等对浙江青田叶腊石的微结构特征进行较系统的研究。结果表明:①粉晶X射线衍射证实青田叶腊石具有典型的单斜晶系特征,该结论与叶腊石粉体选区电子衍射结果吻合,且其伴生矿为石英。②叶腊石微晶体呈"复式板片"构型,且"复式"板片中薄片厚度约为8±2 nm。③在高能电子束辐照下,叶腊石矿物颗粒形貌及晶格结构发生明显的改变,且由此产生晶格膨胀,并最终形成非晶态。
关键词(KeyWords): 叶腊石;微结构;扫描电镜;高分辨透射电镜;选区电子衍射
基金项目(Foundation): 浙江省科技厅重大主题专项(编号:2007C111042);; 浙江省研究生教育创新基金(1004)
作者(Authors): 严俊;张俭;胡仙超;姚程;方伟;盛嘉伟;
DOI: 10.16461/j.cnki.1000-4734.2012.01.019
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